Automatic test generation for verifying microprocessors

Created by W.Langdon from gp-bibliography.bib Revision:1.3973

@Article{Corno:2005:ieeeP,
  author =       "F. Corno and E. Sanchez and M. S. Reorda and 
                 G. Squillero",
  title =        "Automatic test generation for verifying
                 microprocessors",
  journal =      "IEEE Potentials",
  year =         "2005",
  volume =       "24",
  number =       "1",
  pages =        "34--37",
  month =        feb # "-" # mar,
  keywords =     "genetic algorithms, genetic programming",
  ISSN =         "0278-6648",
  DOI =          "doi:10.1109/MP.2005.1405800",
  abstract =     "A pipelined processor with a high-level behavioural
                 HDL description is presented in this paper. It
                 generates a set of effective test programs by using a
                 simulator, which is able to evaluate with respect to an
                 RTL coverage metric. The proposed optimiser is based on
                 a technique called microGP, an evolutionary system able
                 to automatically device and optimizes the program
                 written in an assembly language. Quantitative coverage
                 measurement presented will guide the test-program
                 generation. The approach is fully automatic and broadly
                 applicable. The minimal test set with the programmable
                 coverage is attained.",
}

Genetic Programming entries for Fulvio Corno Ernesto Sanchez Matteo Sonza Reorda Giovanni Squillero

Citations