Automatic test generation for verifying microprocessors

Created by W.Langdon from gp-bibliography.bib Revision:1.4031

  author =       "F. Corno and E. Sanchez and M. S. Reorda and 
                 G. Squillero",
  title =        "Automatic test generation for verifying
  journal =      "IEEE Potentials",
  year =         "2005",
  volume =       "24",
  number =       "1",
  pages =        "34--37",
  month =        feb # "-" # mar,
  keywords =     "genetic algorithms, genetic programming",
  ISSN =         "0278-6648",
  DOI =          "doi:10.1109/MP.2005.1405800",
  abstract =     "A pipelined processor with a high-level behavioural
                 HDL description is presented in this paper. It
                 generates a set of effective test programs by using a
                 simulator, which is able to evaluate with respect to an
                 RTL coverage metric. The proposed optimiser is based on
                 a technique called microGP, an evolutionary system able
                 to automatically device and optimizes the program
                 written in an assembly language. Quantitative coverage
                 measurement presented will guide the test-program
                 generation. The approach is fully automatic and broadly
                 applicable. The minimal test set with the programmable
                 coverage is attained.",

Genetic Programming entries for Fulvio Corno Ernesto Sanchez Matteo Sonza Reorda Giovanni Squillero