Modelling Customer Retention with Statistical Techniques, Rough Data Models and Genetic Programming

Created by W.Langdon from gp-bibliography.bib Revision:1.3872

@InCollection{EEKS98,
  author =       "A. E. Eiben and T. J. Euverman and W. Kowalczyk and 
                 F. Slisser",
  title =        "Modelling Customer Retention with Statistical
                 Techniques, Rough Data Models and Genetic Programming",
  booktitle =    "Rough-Fuzzy Hybridization: A New Trend in Decision
                 Making Fuzzy Sets, Rough Sets and Decision Making
                 Processes",
  publisher =    "Springer-Verlag",
  year =         "1998",
  editor =       "Sankar K. Pal and Andrzej Skowron",
  pages =        "330--345",
  address =      "Berlin",
  keywords =     "genetic algorithms, genetic programming",
  ISBN =         "981-4021-00-8",
  URL =          "http://citeseerx.ist.psu.edu/viewdoc/download;jsessionid=DF680800F7770919CB85C7A704F50DC9?doi=10.1.1.55.7177&rep=rep1&type=pdf",
  size =         "16 pages",
  abstract =     "This paper contains results of a research project
                 aiming at modelling the phenomenon of customer
                 retention. Historical data from a database of a big
                 mutual fund investment company have been analysed with
                 three techniques: logistic regression, rough data
                 models, and genetic programming. Models created by
                 these techniques were used to gain insights into
                 factors influencing customer behaviour and to make
                 predictions on ending the relationship with the company
                 in question. Because the techniques were applied
                 independently of each other, it was possible to make a
                 comparison of their basic features in the context of
                 data mining.",
  notes =        "

                 http://www.amazon.com/Rough-Fuzzy-Hybridization-Decision-Making/dp/9814021008",
}

Genetic Programming entries for Gusz Eiben T J Euverman W Kowalczyk F Slisser

Citations