Evolutionary failing-test generation for modern microprocessors

Created by W.Langdon from gp-bibliography.bib Revision:1.3872

@InProceedings{Sanchez:2011:GECCOcomp,
  author =       "Ernesto Sanchez and Giovanni Squillero and 
                 Alberto Tonda",
  title =        "Evolutionary failing-test generation for modern
                 microprocessors",
  booktitle =    "GECCO '11: Proceedings of the 13th annual conference
                 companion on Genetic and evolutionary computation",
  year =         "2011",
  editor =       "Natalio Krasnogor and Pier Luca Lanzi and 
                 Andries Engelbrecht and David Pelta and Carlos Gershenson and 
                 Giovanni Squillero and Alex Freitas and 
                 Marylyn Ritchie and Mike Preuss and Christian Gagne and 
                 Yew Soon Ong and Guenther Raidl and Marcus Gallager and 
                 Jose Lozano and Carlos Coello-Coello and Dario Landa Silva and 
                 Nikolaus Hansen and Silja Meyer-Nieberg and 
                 Jim Smith and Gus Eiben and Ester Bernado-Mansilla and 
                 Will Browne and Lee Spector and Tina Yu and Jeff Clune and 
                 Greg Hornby and Man-Leung Wong and Pierre Collet and 
                 Steve Gustafson and Jean-Paul Watson and 
                 Moshe Sipper and Simon Poulding and Gabriela Ochoa and 
                 Marc Schoenauer and Carsten Witt and Anne Auger",
  isbn13 =       "978-1-4503-0690-4",
  keywords =     "genetic algorithms, genetic programming, SBSE, Real
                 world applications: Poster",
  pages =        "225--226",
  month =        "12-16 " # jul,
  organisation = "SIGEVO",
  address =      "Dublin, Ireland",
  DOI =          "doi:10.1145/2001858.2001985",
  publisher =    "ACM",
  publisher_address = "New York, NY, USA",
  abstract =     "The incessant progress in manufacturing technology is
                 posing new challenges to microprocessor designers.
                 Nowadays, comprehensive verification of a chip can only
                 be performed after tape-out, when the first silicon
                 prototypes are available. Several activities that were
                 originally supposed to be part of the pre-silicon
                 design phase are migrating to this post-silicon time as
                 well. The short paper describes a post-silicon
                 methodology that can be exploited to devise functional
                 failing tests. Such tests are essential to analyse and
                 debug speed paths during verification, speed-stepping,
                 and other critical activities. The proposed methodology
                 is based on the Genetic Programming paradigm, and
                 exploits a versatile toolkit named muGP. The paper
                 demonstrates that an evolutionary algorithm can
                 successfully tackle a significant and still open
                 industrial problem. Moreover, it shows how to take into
                 account complex hardware characteristics and
                 architectural details of such complex devices.",
  notes =        "Also known as \cite{2001985} Distributed on CD-ROM at
                 GECCO-2011.

                 ACM Order Number 910112.",
}

Genetic Programming entries for Ernesto Sanchez Giovanni Squillero Alberto Tonda

Citations