Exploiting Auto-adaptive $\mu$-GP for Highly Effective Test Programs Generation

Created by W.Langdon from gp-bibliography.bib Revision:1.4208

  author =       "F. Corno and F. Cumani and G. Squillero",
  title =        "Exploiting Auto-adaptive $\mu$-{GP} for Highly
                 Effective Test Programs Generation",
  booktitle =    "Evolvable Systems: From Biology to Hardware, Fifth
                 International Conference, ICES 2003",
  year =         "2003",
  editor =       "Andy M. Tyrrell and Pauline C. Haddow and 
                 Jim Torresen",
  volume =       "2606",
  series =       "LNCS",
  pages =        "262--273",
  address =      "Trondheim, Norway",
  month =        "17-20 " # mar,
  publisher =    "Springer-Verlag",
  keywords =     "genetic algorithms, genetic programming",
  ISBN =         "3-540-00730-X",
  DOI =          "doi:10.1007/3-540-36553-2_24",
  abstract =     "Integrated-circuit producers are shoved by competitive
                 pressure; new devices require increasingly complex
                 verifications to be performed at increasing pace. This
                 paper presents a methodology to automatically induce a
                 test program for a microprocessor that maximizes a
                 given verification metric. The methodology is based on
                 an auto-adaptive evolutionary algorithm and exploits a
                 syntactical description of microprocessor assembly
                 language and an RT-level functional model. Experimental
                 results clearly show the effectiveness of the approach.
                 Comparisons reveal how auto-adaptive mechanisms
                 dramatically enhance both performances and quality of
                 the results.",
  notes =        "ICES-2003",

Genetic Programming entries for Fulvio Corno F Cumani Giovanni Squillero